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Automated Vision Component Inspection |
Superior Speed and Lowest Cost Per Chip Tested; now also 0201!
The Haiku vision inspector is the new visual inspection and sorting system developed and produced in Taiwan. The system is suitable for 4 or 6 sided inspection and sorting of surface mount components such as: MLCC´s, MLV´s, resistors, Ta-caps.
Its unsurpassed cost per chip inspected makes it the most competitive system on the market today. Its in-house developed algorithms allow for a fast, accurate and simple detection of defects using a single PC while using the highest accuracy in vision inspection. The newly developed system will inspect 0201 chips at the unsurpassed 2800 pieces per minute rate.
Rely on these micro component inspection systems to accurately inspect:
• Dimensional Measurements
- Length, width, thickness, termination bandwidth
• Ceramic Defects
- Chip-out, cracks, internal electrode exposure, blisters, bursts, pinholes, scratches, surface contamination, discoloration
• Termination Defects
- Presence, breaks, plating errors, holes, scratches, smears, surface contamination
• Marking
- Presence, placement, readability, correct marking
Distinctive features of the Haiku micro component inspection system include:
• High Speed
- Inspection and rejection:
- 2,800 parts/minute for 4 sided 0402
- 1,600 parts/minute for 4or 6 sided 0805
• Accuracy
- Synchronous grab inspection (part inspection from six sides)
- Resolution of 6 um/pixel possible for 0201 or 0402
• Flexibility
- Auto inspection mode and manual inspection mode
- Automatic calibration of ejector and camera positions
- Programmable detection logic
- Functional parameter set up
- Records and reports pass/fail result for review
- I/O self-check
- Teaching help
- Automatic multi color LED illumination control
• Compact
- Rotation one glass table
- One good bin, retest bin, bad bin or multiple bad bin
• User Friendly
- Set up variable can be stored in a part-specific file
- Set up variable can be storied in an illumination configuration file
- Input parameter on GUI
- Easy to use and maintain
- Save history function system for each data with defect image
- Self-diagnosis function
- Changeable: two near chip sizes in about 15 minutes