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Automated Vision Component Inspection |
Superior Speed and Lowest Cost Per Chip Tested; now also 0201!
The MCIS-pro series is the new visual inspection and sorting system from Right Tek. The system is suitable for 4 or 6 sided inspection and sorting of surface mount components such as: MLCCs, MLVs, resistors, Ta-caps.
Its unsurpassed cost per chip inspected makes it the most competitive system on the market today. Its in-house developed algorithms allow for a fast, accurate and simple detection of defects using a single PC while using the highest accuracy in vision inspection. The newly developed MCIS-1800 series 0603 will inspect 0201 chips at the unsurpassed 1700 pieces per minute rate.
Besides the MCIS-pro system Right Tek also produces a vision inspection retrofit kit for Tape and Reel machines such as Tokyo Weld. This system can be installed and integrated with your packaging unit by our engineers as a turn-key project.
Rely on these micro component inspection systems to accurately inspect:
• Dimensional Measurements
- Length, width, thickness, termination bandwidth
• Ceramic Defects
- Chip-out, cracks, internal electrode exposure, blisters, bursts, pinholes, scratches, surface contamination, discoloration
• Termination Defects
- Presence, breaks, plating errors, holes, scratches, smears, surface contamination
• Marking
- Presence, placement, readability, correct marking
Distinctive features of the MCIS-pro micro component inspection system include:
• High Speed
- Inspection and rejection:
- 2,800 parts/minute for 4 sided 0402
- 1,600 parts/minute for 4or 6 sided 0805
• Accuracy
- Synchronous grab inspection (part inspection from six sides)
- Resolution of 6 um/pixel possible for 0201 or 0402
• Flexibility
- Auto inspection mode and manual inspection mode
- Automatic calibration of ejector and camera positions
- Programmable detection logic
- Functional parameter set up
- Records and reports pass/fail result for review
- I/O self-check
- Teaching help
- Automatic multi color LED illumination control
• Compact
- Rotation one glass table
- One good bin, retest bin, bad bin or multiple bad bin
• User Friendly
- Set up variable can be stored in a part-specific file
- Set up variable can be storied in an illumination configuration file
- Input parameter on GUI
- Easy to use and maintain
- Save history function system for each data with defect image
- Self-diagnosis function
- Changeable: two near chip sizes in about 15 minutes